Scanning Electron Microscope (SEM)

Camfil’s Scanning Electron Microscope (SEM), located at the laboratory in Trosa, is a great example of how committed we are to research and development. This unique tool allows us to study and identify contaminants as small as 50nm (=0,00005mm), found in used filters and air samples. The microscope is used as a problem solving and quality control capability for our customers, and also to study and evaluate new filter media.

Loading samples Free flying particles
Particles in filter

Images from top to bottom, left to right:

  1. Loading of samples into the Scanning Electron Microscope  
  2. Air sample showing the very smallest of particles flying around in the air, from traffic exhaust fumes 
  3. Particles caught in a filter, studied in the SEM
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